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Some issues of automation of test program generation for branch units of microprocessors

Abstract

In this work, some issues of automated construction of test programs intended for functional verification of branch units of microprocessors are considered. Problems appearing when creating such programs are defined, and techniques for their automated solution are suggested. The article focuses on the general issues of branch processing mechanisms and does not touch upon the problems specific for concrete microprocessor architectures. The suggested techniques can be used in industrial test program generators.

About the Author

A. S. Kamkin
ISP RAS, Moscow
Russian Federation


References

1. D. Patterson, J. Henessy. Computer Organization and Design. 3rd Edition, Morgan Kaufmann, 2005.

2. Википедия (http://en.wikipedia.org), статья Branch delay slot.

3. Википедия (http://en.wikipedia.org), статья Branch predictor.

4. T.-Y. Yeh, Y.N. Patt. Two-Level Adaptive Training Branch Prediction. Proceedings of International Symposium on Microarchitecture, 1991.

5. А.С. Камкин. Генерация тестовых программ для микропроцессоров. Труды ИСП РАН, т. 14, ч. 2. М., 2008. С. 23–63.

6. MIPS64™ Architecture For Programmers. Revision 2.0. MIPS Technologies Inc., June 9, 2003.

7. A. Kamkin. MicroTESK: Automation of Test Program Generation for Microprocessors. Proceedings of East-West Design & Test Symposium, 2009.

8. http://hardware.ispras.ru.


Review

For citations:


Kamkin A.S. Some issues of automation of test program generation for branch units of microprocessors. Proceedings of the Institute for System Programming of the RAS (Proceedings of ISP RAS). 2010;18. (In Russ.)



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ISSN 2079-8156 (Print)
ISSN 2220-6426 (Online)