For citations:
Chupilko M.M., Kamkin A.S., Lebedev M.S., Smolov S.A. Test Generation for Digital Hardware Based on High-Level Models. Proceedings of the Institute for System Programming of the RAS (Proceedings of ISP RAS). 2017;29(4):247-256. https://doi.org/10.15514/ISPRAS-2017-29(4)-16